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Concurrent Application of Compaction and Compression for Test Time and Data Volume Reduction in Scan Designs
November 2003 (vol. 52 no. 11)
pp. 1480-1489

Abstract—A test pattern compression scheme for test data volume and application time reduction is proposed. While compression reduces test data volume, the increased number of internal scan chains due to an on-chip, fixed-rate decompressor reduces test application time proportionately. Through on-chip decompression, both the number of virtual scan chains visible to the ATE and the functionality of the ATE are retained intact. Complete fault coverage is guaranteed by constructing the decompression hardware deterministically through analysis of the test pattern set.

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Index Terms:
Test pattern compression, test pattern compaction, scan chains, on-chip decompression, deterministic decompression.
Citation:
Ismet Bayraktaroglu, Alex Orailoglu, "Concurrent Application of Compaction and Compression for Test Time and Data Volume Reduction in Scan Designs," IEEE Transactions on Computers, vol. 52, no. 11, pp. 1480-1489, Nov. 2003, doi:10.1109/TC.2003.1244945
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