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Issue No.07 - July (2003 vol.52)
pp: 896-906
ABSTRACT
<p><b>Abstract</b>—Modulo <tmath>2^n - 1</tmath> adders as fast as <tmath>n{\hbox{-}}{\rm bit}</tmath> 2's complement adders have been recently proposed in the open literature. This makes a Residue Number System (RNS) adder with channels based on the moduli <tmath>2^n </tmath>, <tmath>2^n - 1</tmath>, and any other of the form <tmath>2^k - 1</tmath>, with <tmath>k<n</tmath>, faster than RNS adders based on other moduli. In this paper, we formally derive a parametric, with respect to the adder size, test set, for parallel testing of the channels of an RNS adder based on moduli of the form <tmath>2^n ,2^n - 1,2^k - 1,2^l - 1,\ldots,</tmath> with <tmath>l<k<n</tmath>. The derived test set is reusable; it can be used for any value of <tmath>n, k, l,\ldots</tmath>, regardless of the implementation library used and is composed of <tmath>n^2 + 2</tmath> test vectors. A test-per-clock BIST scheme is also proposed that applies the derived test vectors within <tmath>n^2 + 2n</tmath> cycles. Static CMOS implementations reveal that the proposed BIST offers 100 percent postcompaction fault coverage and an attractive combination of test time and implementation area compared to ROM and FSM-based deterministic BIST or LFSR-based pseudorandom BIST.</p>
INDEX TERMS
Residue Number System, Built-In Self-Test, deterministic and pseudorandom tests, formal test sets.
CITATION
Haridimos T. Vergos, Dimitris Nikolos, Maciej Bellos, Costas Efstathiou, "Deterministic BIST for RNS Adders", IEEE Transactions on Computers, vol.52, no. 7, pp. 896-906, July 2003, doi:10.1109/TC.2003.1214338
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