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| A. Steininger, C. Scherrer, "Identifying Efficient Combinations of Error Detection Mechanisms Based on Results of Fault Injection Experiments," IEEE Transactions on Computers, vol. 51, no. 2, pp. 235-239, February, 2002. | |||
| BibTex | x | ||
| @article{ 10.1109/12.980011, author = {A. Steininger and C. Scherrer}, title = {Identifying Efficient Combinations of Error Detection Mechanisms Based on Results of Fault Injection Experiments}, journal ={IEEE Transactions on Computers}, volume = {51}, number = {2}, issn = {0018-9340}, year = {2002}, pages = {235-239}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.980011}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Identifying Efficient Combinations of Error Detection Mechanisms Based on Results of Fault Injection Experiments IS - 2 SN - 0018-9340 SP235 EP239 EPD - 235-239 A1 - A. Steininger, A1 - C. Scherrer, PY - 2002 KW - Error detection KW - fault injection KW - coverage estimation KW - optimization of fault tolerance. VL - 51 JA - IEEE Transactions on Computers ER - | |||
We introduce novel performance ratings for error detection mechanisms. Given a proper setup of the fault injection experiments, these ratings can be directly computed from raw readout data. They allow the evaluation of the overall performance of arbitrary combinations of mechanisms without the need for further experiments. With this means we can determine a minimal subset of mechanisms that still provides the required performance.
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