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Test Generation and Testability Alternatives Exploration of Critical Algorithms for Embedded Applications
February 2002 (vol. 51 no. 2)
pp. 200-215

This paper presents an analysis of the behavioral descriptions of embedded systems to generate behavioral test patterns used to perform the exploration of design alternatives based on testability. In this way, during the hardware/software partitioning of the embedded system, testability aspects can be considered. The paper presents an innovative error model for algorithmic (behavioral) descriptions, which allows for the generation of behavioral test patterns. They are converted into gate-level test sequences by using more or less accurate procedures based on scheduling information or both scheduling and allocation information. The paper experimentally shows that such converted gate-level test sequences provide a very high stuck-at fault coverage, when applied to different gate-level implementations of the given behavioral specification. For this reason, our behavioral test patterns can be used to explore testability alternatives, by simply performing fault simulation at the gate level with the same set of patterns without regenerating them for each circuit. Furthermore, whenever gate-level ATPGs are applied on the synthesized gate-level circuits, they obtain lower fault coverage, with respect to our behavioral test patterns, in particular when considering circuits with hard to detect faults.

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Index Terms:
Testing of embedded systems, ATPG, fault modeling, testability analysis, VHDL.
Citation:
F. Ferrandi, F. Fummi, D. Sciuto, "Test Generation and Testability Alternatives Exploration of Critical Algorithms for Embedded Applications," IEEE Transactions on Computers, vol. 51, no. 2, pp. 200-215, Feb. 2002, doi:10.1109/12.980008
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