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Issue No.07 - July (2001 vol.50)
pp: 674-688
ABSTRACT
<p><b>Abstract</b>—This paper presents a new pseudoexhaustive test methodology for digital finite impulse response (FIR) filters. The proposed scheme can be employed to detect any combinational faults within the basic cell of the functional units occurring in linear phase comb filters, trees of sign-extended adders and phase-shift multipliers. It uses additive generators as a source of pseudo-exhaustive patterns to systematically test all FIR filter building blocks.</p>
INDEX TERMS
Complex multipliers, design for testability, FIR filters, pseudoexhaustive testing, sign-extended adders, cell fault model, state coverage, trees of adders.
CITATION
Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, "Testing Schemes for FIR Filter Structures", IEEE Transactions on Computers, vol.50, no. 7, pp. 674-688, July 2001, doi:10.1109/12.936234
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