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| Prabir Dasgupta, Santanu Chattopadhyay, P. Pal Chaudhuri, Indranil Sengupta, "Cellular Automata-Based Recursive Pseudoexhaustive Test Pattern Generator," IEEE Transactions on Computers, vol. 50, no. 2, pp. 177-185, February, 2001. | |||
| BibTex | x | ||
| @article{ 10.1109/12.908993, author = {Prabir Dasgupta and Santanu Chattopadhyay and P. Pal Chaudhuri and Indranil Sengupta}, title = {Cellular Automata-Based Recursive Pseudoexhaustive Test Pattern Generator}, journal ={IEEE Transactions on Computers}, volume = {50}, number = {2}, issn = {0018-9340}, year = {2001}, pages = {177-185}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.908993}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Cellular Automata-Based Recursive Pseudoexhaustive Test Pattern Generator IS - 2 SN - 0018-9340 SP177 EP185 EPD - 177-185 A1 - Prabir Dasgupta, A1 - Santanu Chattopadhyay, A1 - P. Pal Chaudhuri, A1 - Indranil Sengupta, PY - 2001 KW - Data path architecture KW - pseudoexhaustive testing KW - BIST KW - cellular automata. VL - 50 JA - IEEE Transactions on Computers ER - | |||
Abstract—This paper presents a recursive technique for generation of pseudoexhaustive test patterns. The scheme is optimal in the sense that the first
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