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Ugur Kalay, Marek A. Perkowski, Douglas V. Hall, "A Minimal Universal Test Set for SelfTest of EXORSumofProducts Circuits," IEEE Transactions on Computers, vol. 49, no. 3, pp. 267276, March, 2000.  
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@article{ 10.1109/12.841130, author = {Ugur Kalay and Marek A. Perkowski and Douglas V. Hall}, title = {A Minimal Universal Test Set for SelfTest of EXORSumofProducts Circuits}, journal ={IEEE Transactions on Computers}, volume = {49}, number = {3}, issn = {00189340}, year = {2000}, pages = {267276}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.841130}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
RefWorks Procite/RefMan/Endnote  x  
TY  JOUR JO  IEEE Transactions on Computers TI  A Minimal Universal Test Set for SelfTest of EXORSumofProducts Circuits IS  3 SN  00189340 SP267 EP276 EPD  267276 A1  Ugur Kalay, A1  Marek A. Perkowski, A1  Douglas V. Hall, PY  2000 KW  Universal test set KW  ANDEXOR realizations KW  ReedMuller expressions KW  single stuckat fault model KW  easily testable combinational networks KW  Design for Testing (DFT) KW  selftestable circuits KW  Builtin SelfTest (BIST) KW  test pattern generation. VL  49 JA  IEEE Transactions on Computers ER   
Abstract—A testable EXORSumofProducts (ESOP) circuit realization and a simple, universal test set which detects all single stuckat faults in the internal lines and the primary inputs/outputs of the realization are given. Since ESOP is the most general form of ANDEXOR representations, our realization and test set are more versatile than those described by other researchers for the restricted GRM, FPRM, and PPRM forms of ANDEXOR circuits. Our circuit realization requires only two extra inputs for controllability and one extra output for observability. The cardinality of our test set for an
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