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| Irith Pomeranz, Sudhakar M. Reddy, "On Finding a Minimal Functional Description of a Finite-State Machine for Test Generation for Adjacent Machines," IEEE Transactions on Computers, vol. 49, no. 1, pp. 88-94, January, 2000. | |||
| BibTex | x | ||
| @article{ 10.1109/12.822567, author = {Irith Pomeranz and Sudhakar M. Reddy}, title = {On Finding a Minimal Functional Description of a Finite-State Machine for Test Generation for Adjacent Machines}, journal ={IEEE Transactions on Computers}, volume = {49}, number = {1}, issn = {0018-9340}, year = {2000}, pages = {88-94}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.822567}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - On Finding a Minimal Functional Description of a Finite-State Machine for Test Generation for Adjacent Machines IS - 1 SN - 0018-9340 SP88 EP94 EPD - 88-94 A1 - Irith Pomeranz, A1 - Sudhakar M. Reddy, PY - 2000 KW - Finite-state machines KW - minimal descriptions KW - test generation. VL - 49 JA - IEEE Transactions on Computers ER - | |||
Abstract—In some applications, it is desirable to find for a circuit a minimal partial description that allows a certain task to be carried out. A partial circuit description allows the task to be carried out more efficiently since fewer decision points exist based on a partial description compared to the full circuit description. We consider this problem with respect to finite state machines and the following tasks. Starting from a functional description of a finite state machine
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