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Issue No.01 - January (2000 vol.49)
pp: 88-94
ABSTRACT
<p><b>Abstract</b>—In some applications, it is desirable to find for a circuit a minimal partial description that allows a certain task to be carried out. A partial circuit description allows the task to be carried out more efficiently since fewer decision points exist based on a partial description compared to the full circuit description. We consider this problem with respect to finite state machines and the following tasks. Starting from a functional description of a finite state machine <tmath>$M$</tmath> in the form of a state table <tmath>$ST$</tmath>, we select a minimal subset of state-transitions <tmath>$ST_{part} \subset ST$</tmath> such that every output sequence that can be produced using state-transitions out of <tmath>$ST$</tmath> can also be produced using state-transitions out of <tmath>$ST_{part}$</tmath>. We also formulate a similar problem related to the propagation of fault effects from the inputs to the outputs of <tmath>$M$</tmath> and describe a procedure for solving this problem. Applications of these tasks include test generation for circuits described as interconnections of finite-state machines. Experimental results presented show that <tmath>$ST_{part}$</tmath> contains a small fraction of the state-transitions of <tmath>$ST$</tmath>.</p>
INDEX TERMS
Finite-state machines, minimal descriptions, test generation.
CITATION
Irith Pomeranz, Sudhakar M. Reddy, "On Finding a Minimal Functional Description of a Finite-State Machine for Test Generation for Adjacent Machines", IEEE Transactions on Computers, vol.49, no. 1, pp. 88-94, January 2000, doi:10.1109/12.822567
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