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On Finding a Minimal Functional Description of a Finite-State Machine for Test Generation for Adjacent Machines
January 2000 (vol. 49 no. 1)
pp. 88-94

Abstract—In some applications, it is desirable to find for a circuit a minimal partial description that allows a certain task to be carried out. A partial circuit description allows the task to be carried out more efficiently since fewer decision points exist based on a partial description compared to the full circuit description. We consider this problem with respect to finite state machines and the following tasks. Starting from a functional description of a finite state machine $M$ in the form of a state table $ST$, we select a minimal subset of state-transitions $ST_{part} \subset ST$ such that every output sequence that can be produced using state-transitions out of $ST$ can also be produced using state-transitions out of $ST_{part}$. We also formulate a similar problem related to the propagation of fault effects from the inputs to the outputs of $M$ and describe a procedure for solving this problem. Applications of these tasks include test generation for circuits described as interconnections of finite-state machines. Experimental results presented show that $ST_{part}$ contains a small fraction of the state-transitions of $ST$.

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Index Terms:
Finite-state machines, minimal descriptions, test generation.
Citation:
Irith Pomeranz, Sudhakar M. Reddy, "On Finding a Minimal Functional Description of a Finite-State Machine for Test Generation for Adjacent Machines," IEEE Transactions on Computers, vol. 49, no. 1, pp. 88-94, Jan. 2000, doi:10.1109/12.822567
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