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Jacob Savir, "Distributed Generation of Weighted Random Patterns," IEEE Transactions on Computers, vol. 48, no. 12, pp. 13641368, December, 1999.  
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@article{ 10.1109/12.817399, author = {Jacob Savir}, title = {Distributed Generation of Weighted Random Patterns}, journal ={IEEE Transactions on Computers}, volume = {48}, number = {12}, issn = {00189340}, year = {1999}, pages = {13641368}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.817399}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
RefWorks Procite/RefMan/Endnote  x  
TY  JOUR JO  IEEE Transactions on Computers TI  Distributed Generation of Weighted Random Patterns IS  12 SN  00189340 SP1364 EP1368 EPD  13641368 A1  Jacob Savir, PY  1999 KW  LSSD KW  SRL KW  BIST KW  WRP KW  signal probability KW  detection probability. VL  48 JA  IEEE Transactions on Computers ER   
Abstract—This paper describes the design details, operation, cost, and performance of a distributed weighted pattern test approach at the chip level. The traditional LSSD SRLs are being replaced by WRP SRLs designed specifically to facilitate a weighted random pattern (WRP) test. A twobit code is transmitted to each WRP SRL to determine its specific weight. The WRP test is then divided into groups, where each group is activated with a different set of weights. The weights are dynamically adjusted during the course of the test to “go after” the remaining untested faults. The cost and performance of this design system are explored on ten pilot chips. Results of this experiment are provided in the paper.
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