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Diagnosis of Scan Cells in BIST Environment
July 1999 (vol. 48 no. 7)
pp. 724-731

Abstract—The paper presents a new fault diagnosis technique for scan-based designs with BIST. It can be used for nonadaptive identification of the scan cells that are driven by erroneous signals. The proposed scheme employs a pseudorandom scan cell selection routine which, in conjunction with a conventional signature analysis and simple reasoning procedure, allows flexible trade-offs between the test application time and the diagnostic resolution.

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Index Terms:
Built-in self-test, design for testability, fault diagnosis, multiple scan chains, scan-based design, test-response compaction.
Janusz Rajski, Jerzy Tyszer, "Diagnosis of Scan Cells in BIST Environment," IEEE Transactions on Computers, vol. 48, no. 7, pp. 724-731, July 1999, doi:10.1109/12.780879
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