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Issue No.04 - April (1999 vol.48)
pp: 442-448
ABSTRACT
<p><b>Abstract</b>—Beerel [<ref rid="bibT04421" type="bib">1</ref>] showed that semimodular asynchronous circuits are totally self-checking with respect to multiple output stuck-at faults that are nonexitory and nonsubstitutional. We show that, in circuits with atomic gate implementations, it is possible to ensure that all exitory multiple output stuck-at faults will cause the circuit to halt.</p>
INDEX TERMS
Asynchronous circuits, semimodular circuits, testability, totally self-checking circuits.
CITATION
Michael J. Liebelt, Neil Burgess, "Detecting Exitory Stuck-At Faults in Semimodular Asynchronous Circuits", IEEE Transactions on Computers, vol.48, no. 4, pp. 442-448, April 1999, doi:10.1109/12.762538
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