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Detecting Exitory Stuck-At Faults in Semimodular Asynchronous Circuits
April 1999 (vol. 48 no. 4)
pp. 442-448

Abstract—Beerel [1] showed that semimodular asynchronous circuits are totally self-checking with respect to multiple output stuck-at faults that are nonexitory and nonsubstitutional. We show that, in circuits with atomic gate implementations, it is possible to ensure that all exitory multiple output stuck-at faults will cause the circuit to halt.

[1] P.A. Beerel, “CAD Tools for the Synthesis, Verification, and Testability of Robust Asynchronous Circuits,” PhD thesis, Stanford Univ., 1994.
[2] M. Abramovici, M.A. Breuer, and A.D. Friedman, Digital Systems Testing and Testable Design. IEEE Press, 1990.
[3] H. Hulgaard, S.M. Burns, and G. Borriello, “Testing Asynchronous Circuits: A Survey,” Integration, the VLSI J., vol. 19, pp. 111-131, Nov. 1995.
[4] Self-Timed Control of Concurrent Processes: The Design of Aperiodic Logical Circuits in Computers and Discrete Systems, V.I. Varshavsky, ed. Dordrecht, The Netherlands: Kluwer Academic, 1990.
[5] P. Beerel and T.-Y. Meng, “Semi-Modularity and Testability of Speed-Independent Circuits,” Integration, the VLSI J., vol. 13, pp. 301-322, Sept. 1992.
[6] P.J. Hazewindus, “Testing Delay-Insensitive Circuits,” PhD thesis, California Inst. of Tech nology, 1992.
[7] D.E. Muller and W.S. Bartky, “A Theory of Asynchronous Circuits,” Proc. Int'l Symp. Theory of Switching, pp. 204-243, Harvard Univ. Press, Apr. 1959.
[8] M. Kishinevsky et al., Concurrent Hardware: The Theory and Practice of Self-Timed Design, John Wiley and Sons, London, 1993.
[9] S. Banerjee, “New Techniques for Synthesis and Testing of Asynchronous Circuits,” PhD thesis, Univ. of Massachusetts, Amherst, May 1995.

Index Terms:
Asynchronous circuits, semimodular circuits, testability, totally self-checking circuits.
Citation:
Michael J. Liebelt, Neil Burgess, "Detecting Exitory Stuck-At Faults in Semimodular Asynchronous Circuits," IEEE Transactions on Computers, vol. 48, no. 4, pp. 442-448, April 1999, doi:10.1109/12.762538
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