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Detecting Exitory Stuck-At Faults in Semimodular Asynchronous Circuits
April 1999 (vol. 48 no. 4)
pp. 442-448

Abstract—Beerel [1] showed that semimodular asynchronous circuits are totally self-checking with respect to multiple output stuck-at faults that are nonexitory and nonsubstitutional. We show that, in circuits with atomic gate implementations, it is possible to ensure that all exitory multiple output stuck-at faults will cause the circuit to halt.

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Index Terms:
Asynchronous circuits, semimodular circuits, testability, totally self-checking circuits.
Michael J. Liebelt, Neil Burgess, "Detecting Exitory Stuck-At Faults in Semimodular Asynchronous Circuits," IEEE Transactions on Computers, vol. 48, no. 4, pp. 442-448, April 1999, doi:10.1109/12.762538
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