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Configuration of Locally Spared Arrays in the Presence of Multiple Fault Types
April 1999 (vol. 48 no. 4)
pp. 398-416

Abstract—The bulk of results for the performance of configuration architectures treat the case of failed processors, but neglect switches that are stuck open or closed. By contrast, the present work characterizes this multivariate problem in the presence of either iid or clustered faults. Suppose that the designer wishes to assure, with high probability, a fault free $s \times t$ array. If local sparing is used then, as we prove, the area of the redundant array is 1) $\Theta(st\; \log st)$ in the presence of faulty elements or faulty elements and switches stuck open; 2) $\Theta(st\; \log^2 st)$ in the presence of faulty elements and switches stuck closed; 3) $\Theta([st]^2\; \log st)$ in the presence of faulty elements and switches that may be either stuck open or stuck closed. We also furnish bounds on maximum wirelength and an optimal configuration algorithm.

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Index Terms:
Configuration architectures, fault tolerance, local sparing, systolic arrays.
Citation:
Laurence E. LaForge, "Configuration of Locally Spared Arrays in the Presence of Multiple Fault Types," IEEE Transactions on Computers, vol. 48, no. 4, pp. 398-416, April 1999, doi:10.1109/12.762532
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