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A Unified Analytical Expression for Aliasing Error Probability Using Single-Input External- and Internal-XOR LFSR
December 1998 (vol. 47 no. 12)
pp. 1414-1417

Abstract—In this paper, an exact unified analytical expression for the transient (and the steady state) behavior of the Aliasing Error Probability (AEP) of signature analysis testing using single-input external- and internal-XOR LFSR is deduced. The expression, contrary to what is known in the literature, uses the leftmost bit of the LFSR.

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Index Terms:
Signature analysis, linear feedback shift register, aliasing, transient behavior, digital testing, VLSI.
Citation:
Mahmoud S. Elsaholy, Samir I. Shaheen, Reda H. Seireg, "A Unified Analytical Expression for Aliasing Error Probability Using Single-Input External- and Internal-XOR LFSR," IEEE Transactions on Computers, vol. 47, no. 12, pp. 1414-1417, Dec. 1998, doi:10.1109/12.737687
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