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A Unified Analytical Expression for Aliasing Error Probability Using Single-Input External- and Internal-XOR LFSR
December 1998 (vol. 47 no. 12)
pp. 1414-1417

Abstract—In this paper, an exact unified analytical expression for the transient (and the steady state) behavior of the Aliasing Error Probability (AEP) of signature analysis testing using single-input external- and internal-XOR LFSR is deduced. The expression, contrary to what is known in the literature, uses the leftmost bit of the LFSR.

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Index Terms:
Signature analysis, linear feedback shift register, aliasing, transient behavior, digital testing, VLSI.
Mahmoud S. Elsaholy, Samir I. Shaheen, Reda H. Seireg, "A Unified Analytical Expression for Aliasing Error Probability Using Single-Input External- and Internal-XOR LFSR," IEEE Transactions on Computers, vol. 47, no. 12, pp. 1414-1417, Dec. 1998, doi:10.1109/12.737687
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