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Optimal Zero-Aliasing Space Compaction of Test Responses
November 1998 (vol. 47 no. 11)
pp. 1171-1187

Abstract—Many built-in self-testing (BIST) schemes compress the test responses from a k-output circuit to q signature streams, where q << k, a process termed space compaction. The effectiveness of such a compaction method can be measured by its compaction ratio c = k/q. A high compaction ratio can introduce aliasing, which occurs when a faulty test response maps to the fault-free signature. We investigate the problem of designing zero-aliasing space compaction circuits with maximum compaction ratio cmax. We introduce a graph representation of test responses to study the space compaction process and relate space compactor design to a graph coloring problem. Given a circuit under test, a fault model, and a test set, we determine qmin, which yields cmax = k/qmin. This provides a fundamental bound on the cost of signature-based BIST. We show that qmin≤ 2 for all the ISCAS 85 benchmark circuits. We develop a systematic design procedure for the synthesis of space compaction circuits and apply it to a number of ISCAS 85 circuits. Finally, we describe multistep compaction, which allows zero aliasing to be achieved with any q, even when qmin > 1.

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Index Terms:
Aliasing, built-in self-testing, fault coverage, graph coloring, multistep compaction.
Krishnendu Chakrabarty, Brian T. Murray, John P. Hayes, "Optimal Zero-Aliasing Space Compaction of Test Responses," IEEE Transactions on Computers, vol. 47, no. 11, pp. 1171-1187, Nov. 1998, doi:10.1109/12.736427
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