This Article 
 Bibliographic References 
 Add to: 
Salvaging Test Windows in BIST Diagnostics
April 1998 (vol. 47 no. 4)
pp. 486-491

Abstract—This paper uses the STUMPS architecture to study the properties of a new diagnostic procedure. According to the old procedure, the process stops at the end of each test window to compare the measured signature against its precomputed value. The old procedure also calls for the abandonment of all future test windows after the first failing one is encountered. This is due to the unavailability of expected future test window signatures in the presence of a previously captured error. This paper shows a simple method of salvaging future test windows by adjusting their expected signatures to fit past observed errors. Experiments conducted using this new procedure reveal an improvement of at least one order of magnitude in diagnostic resolution over what has been previously experienced.

[1] M. Abramovici, M.A. Breuer, and A.D. Friedman, Digital Systems Testing and Testable Design. IEEE Press, 1990.
[2] P.H. Bardell and M.J. Lapointe, "Production Experience with Built-In Self-Test in the IBM ES/9000 System," Proc. Int'l Test Conf., pp. 28-36, Oct. 1991.
[3] P.H. Bardell and W.H. McAnney, "Self-Testing of Multichip Logic Modules," Proc. Int'l Test Conf., pp. 200-204, 1982.
[4] P.H. Bardell, W.H. McAnney, and J. Savir, Built-In Test for VLSI, John Wiley&Sons, New York, 1987.
[5] T. Damarla, C.E. Stroud, and A. Sathaye, “Multiple Error Detection and Identification via Signature Analysis,” J. Electronic Testing: Theory and Applications, vol. 7, no. 3, pp. 193-207, 1995.
[6] E.B. Eichelberger and T.W. Williams, "A Logic Design Structure for LSI Testability," J. Design Automation and Fault-Tolerant Computing, vol. 2, pp. 165-178, 1978.
[7] W.H. McAnney and J. Savir, "There Is Information in Faulty Signatures," Proc. Int'l Test Conf., pp. 630-636, Sept. 1987.
[8] J. Savir, Salvaging Test Windows in BIST Diagnostics Proc. VLSI Test Symp., pp. 416-425, 1997.
[9] J. Savir and W.H. McAnney, “Identification of Failing Tests with Cycling Registers,” Proc. Int'l Test Conf., pp. 322-328, 1988.
[10] C.E. Stroud and T. Damarla, “Improving the Efficiency of Error Identification via Signature Analysis,” Proc. VLSI Test Symp., pp. 244-249, 1995.

Index Terms:
BIST diagnostics, signature analysis, error signature, MISR, LFSR, autonomous MISR.
Jacob Savir, "Salvaging Test Windows in BIST Diagnostics," IEEE Transactions on Computers, vol. 47, no. 4, pp. 486-491, April 1998, doi:10.1109/12.675718
Usage of this product signifies your acceptance of the Terms of Use.