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Danial J. Neebel, Charles R. Kime, "Cellular Automata for Weighted Random Pattern Generation," IEEE Transactions on Computers, vol. 46, no. 11, pp. 12191229, November, 1997.  
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@article{ 10.1109/12.644297, author = {Danial J. Neebel and Charles R. Kime}, title = {Cellular Automata for Weighted Random Pattern Generation}, journal ={IEEE Transactions on Computers}, volume = {46}, number = {11}, issn = {00189340}, year = {1997}, pages = {12191229}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.644297}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
RefWorks Procite/RefMan/Endnote  x  
TY  JOUR JO  IEEE Transactions on Computers TI  Cellular Automata for Weighted Random Pattern Generation IS  11 SN  00189340 SP1219 EP1229 EPD  12191229 A1  Danial J. Neebel, A1  Charles R. Kime, PY  1997 KW  Builtin selftest KW  weighted random patterns KW  multiple weight sets KW  cellular automata KW  hybrid cellular automata KW  weighted cellular automata KW  testperclock pattern generation. VL  46 JA  IEEE Transactions on Computers ER   
Abstract—Fault testing randompatternresistant circuits requires that BIST (builtin selftest) techniques generate large numbers of pseudorandom patterns. To shorten these long test lengths, this study describes a cellular automatabased method that efficiently generates weighted pseudorandom BIST patterns. This structure, called a
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