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Globally Optimal Diagnosis in Systems with Random Faults
February 1997 (vol. 46 no. 2)
pp. 200-204

Abstract—We consider probabilistic diagnosis in multiprocessor systems. Processors can test one another; fault-free processors give correct test results, while faulty testers are unpredictable. Processors fail independently with constant probability p < 1/2 and the goal is to identify correctly the status of all processors, based on the set of test results. A diagnosis algorithm is globally optimal if it has the highest probability of correctness among all (deterministic) diagnosis algorithms. We give fast globally optimal diagnosis algorithms for a class of test assignments including complete directed graphs and directed acyclic graphs. This is the first time that globally optimal diagnosis is given in a probabilistic model without any assumptions on the behavior of faulty processors.

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Index Terms:
Random fault, syndrome, system-level diagnosis.
Citation:
Krzysztof Diks, Andrzej Pelc, "Globally Optimal Diagnosis in Systems with Random Faults," IEEE Transactions on Computers, vol. 46, no. 2, pp. 200-204, Feb. 1997, doi:10.1109/12.565598
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