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Dimitrios Kagaris, Spyros Tragoudas, Amitava Majumdar, "On the Use of Counters for Reproducing Deterministic Test Sets," IEEE Transactions on Computers, vol. 45, no. 12, pp. 14051419, December, 1996.  
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@article{ 10.1109/12.545970, author = {Dimitrios Kagaris and Spyros Tragoudas and Amitava Majumdar}, title = {On the Use of Counters for Reproducing Deterministic Test Sets}, journal ={IEEE Transactions on Computers}, volume = {45}, number = {12}, issn = {00189340}, year = {1996}, pages = {14051419}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.545970}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
RefWorks Procite/RefMan/Endnote  x  
TY  JOUR JO  IEEE Transactions on Computers TI  On the Use of Counters for Reproducing Deterministic Test Sets IS  12 SN  00189340 SP1405 EP1419 EPD  14051419 A1  Dimitrios Kagaris, A1  Spyros Tragoudas, A1  Amitava Majumdar, PY  1996 KW  Builtin selftest KW  test pattern generation KW  deterministic test set KW  binary counter KW  binary matrix column permutations. VL  45 JA  IEEE Transactions on Computers ER   
Abstract—We propose a very simple and fast CAD tool to check whether a binary counter can reproduce a predetermined set of test patterns in a reasonable time. Given a test matrix
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