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R.D. (Shawn) Blanton, John P. Hayes, "Testability of Convergent Tree Circuits," IEEE Transactions on Computers, vol. 45, no. 8, pp. 950963, August, 1996.  
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@article{ 10.1109/12.536237, author = {R.D. (Shawn) Blanton and John P. Hayes}, title = {Testability of Convergent Tree Circuits}, journal ={IEEE Transactions on Computers}, volume = {45}, number = {8}, issn = {00189340}, year = {1996}, pages = {950963}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.536237}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
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TY  JOUR JO  IEEE Transactions on Computers TI  Testability of Convergent Tree Circuits IS  8 SN  00189340 SP950 EP963 EPD  950963 A1  R.D. (Shawn) Blanton, A1  John P. Hayes, PY  1996 KW  Testability KW  designfortestability KW  synthesisfortestability KW  Ctestability KW  test generation KW  regular circuits KW  iterative logic arrays KW  tree circuits KW  functional testing. VL  45 JA  IEEE Transactions on Computers ER   
Abstract—The testing properties of a class of regular circuits called convergent trees are investigated. Convergent trees include such practical circuits as comparators, multiplexers, and carrylookahead adders. The conditions for the testability of these tree circuits are derived for a functional fault model. The notion of Ltestability is introduced, where the number of tests for a
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