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Comments on "Line Digraph Iterations and Connectivity Analysis of de Bruijn and Kautz Graphs"
June 1996 (vol. 45 no. 6)
pp. 768

Abstract—The aim of this note is to present some counterexamples to the results in the paper by Du, Lyuu, and Hsu published in this Transactions [1].

[1] D.-Z. Du,Y.-D. Lyuu,, and D.F. Hsu,“Line digraph iterations and connectivity analysis of de Bruijn and Kautzgraph,” IEEE Trans. Computers, vol. 42, no. 5, pp. 612-616, May 1993.
[2] M.A. Fiol and J.L.A. Yebra, "Dense Bipartite Digraphs," J. Graph Theory, vol. 14, pp. 687-700, 1990.

Index Terms:
Connectivity, diameter-vulnerability, fault-tolerance, line digraph iteration, spread.
Citation:
C. Padró, P. Morillo, M.a. Fiol, "Comments on "Line Digraph Iterations and Connectivity Analysis of de Bruijn and Kautz Graphs"," IEEE Transactions on Computers, vol. 45, no. 6, pp. 768, June 1996, doi:10.1109/12.506435
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