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Design of Self-Testing Checkers for Borden Codes
April 1996 (vol. 45 no. 4)
pp. 461-469

Abstract—The optimal codes C(n, t) capable of detecting t-unidirectional errors in an n-bit vector were defined by Borden. Unidirectional errors have been observed in modern digital devices such as PLA's, ROM's, and compact laser disks. In this paper, a new approach to designing self-testing checkers (STCs) for Borden codes is proposed. The new STC is built of a self-testing code-disjoint translator of the Borden code into the 1-out-of-z code (z≥ 2) and—if z = 3 or 4—an STC for the 1-out-of-z code. The translator is built of two multi-output threshold circuits with $\lfloor n/2 \rfloor$ and $\lceil n/2 \rceil$ inputs and a merging network. Compared to existing STC's for Borden codes the new checker generally uses significantly less hardware. It also enjoys a modular and highly regular structure which makes it attractive for VLSI implementation.

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Index Terms:
Borden code, concurrent error detection, easily-testable circuit, multioutput threshold circuit, optimal t-unidirectional error detecting code, self-testing checker, unidirectional errors, unidirectional error detecting code.
Stanislaw J. Piestrak, "Design of Self-Testing Checkers for Borden Codes," IEEE Transactions on Computers, vol. 45, no. 4, pp. 461-469, April 1996, doi:10.1109/12.494103
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