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JienChung Lo, Eiji Fujiwara, "Probability to Achieve TSC Goal," IEEE Transactions on Computers, vol. 45, no. 4, pp. 450460, April, 1996.  
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@article{ 10.1109/12.494102, author = {JienChung Lo and Eiji Fujiwara}, title = {Probability to Achieve TSC Goal}, journal ={IEEE Transactions on Computers}, volume = {45}, number = {4}, issn = {00189340}, year = {1996}, pages = {450460}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.494102}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
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TY  JOUR JO  IEEE Transactions on Computers TI  Probability to Achieve TSC Goal IS  4 SN  00189340 SP450 EP460 EPD  450460 A1  JienChung Lo, A1  Eiji Fujiwara, PY  1996 KW  Concurrent error detection KW  embedded circuits KW  error control coding KW  failure rate KW  fault modeling KW  probabilistic measure KW  physical layout for testability. VL  45 JA  IEEE Transactions on Computers ER   
Abstract—In this paper we propose a probabilistic measure for selfchecking (SC) circuits that is analogous to reliability of faulttolerant systems. This measure is defined as the probability to achieve totally selfchecking (TSC) goal at the
The SC properties are obtained through adding hardware redundancy to the original digital design. Which means that an SC circuit has a higher failure rate than the original circuit. Further, there are tradeoffs between the level of hardware redundancy, the reliability, and the TSCG. We give several examples in this paper to clearly demonstrate these tradeoffs for different design environments. The proposed probability measure allows designers to choose from costeffective SC designs that are suitable for their specifications.
We emphasize that the TSCG is intended to provide a mean of dynamic error handling performance evaluation of SC designs. The TSC definitions and alike are still intact, since a costeffective SC circuit must begin with a TSC circuit. The TSCG gives confidence in the use of costefficient error control codes and/or reduction in error handling capability. Analogous to reliability, the TSCG can be used in product specifications. This is a crucial step toward the practical applications of TSC or CED circuits.
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