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Producing Reliable Initialization and Test of Sequential Circuits with Pseudorandom Vectors
October 1995 (vol. 44 no. 10)
pp. 1251-1256

Abstract—In this paper, the initialization of sequential circuits using pseudorandom input patterns is addressed. An extended Markov chain model that covers the initialization phase is proposed. This model support the theoretical framework used to demonstrate that sequential circuits can be initialized with pseudorandom vectors. This leads to a uniform BIST approach in which initialization and testing are performed together with a single pseudorandom generator.

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Index Terms:
Built-in self-testing, full reset, partial reset, initialization of sequential circuits, pseudorandom testing, modelization of sequential circuits, Markov chain processes, testability measures.
Y. Savaria, M. Soufi, F. Darlay, B. Kaminska, "Producing Reliable Initialization and Test of Sequential Circuits with Pseudorandom Vectors," IEEE Transactions on Computers, vol. 44, no. 10, pp. 1251-1256, Oct. 1995, doi:10.1109/12.467701
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