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Issue No.08 - August (1995 vol.44)
pp: 1055-1059
ABSTRACT
<p><it>Abstract</it>—Paschalis et al. in [<ref rid="BIBC105512" type="bib">12</ref>] have given a structured method to design TSC <it>m</it>-out-of-2<it>m</it> code checkers suitable for VLSI implementation. In this correspondence we give sufficient conditions so that the method given in [<ref rid="BIBC105512" type="bib">12</ref>] can be used to design checkers for classes of <it>m</it>-out-of-<it>n</it> codes with <it>n</it>≠ 2<it>m</it>.</p>
INDEX TERMS
Fault detection, fault tolerance, MOS transistor implementation, m-out-of-n code, totally self-checking checkers.
CITATION
G. Sourtziotis, V. V. Dimakopoulos, A. Paschalis, D. Nikolos, "On TSC Checkers for m-out-of-n Codes", IEEE Transactions on Computers, vol.44, no. 8, pp. 1055-1059, August 1995, doi:10.1109/12.403723
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