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Amitava Majumdar, Sarma B. K. Vrudhula, "Fault Coverage and Test Length Estimation for Random Pattern Testing," IEEE Transactions on Computers, vol. 44, no. 2, pp. 234247, February, 1995.  
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@article{ 10.1109/12.364535, author = {Amitava Majumdar and Sarma B. K. Vrudhula}, title = {Fault Coverage and Test Length Estimation for Random Pattern Testing}, journal ={IEEE Transactions on Computers}, volume = {44}, number = {2}, issn = {00189340}, year = {1995}, pages = {234247}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.364535}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
RefWorks Procite/RefMan/Endnote  x  
TY  JOUR JO  IEEE Transactions on Computers TI  Fault Coverage and Test Length Estimation for Random Pattern Testing IS  2 SN  00189340 SP234 EP247 EPD  234247 A1  Amitava Majumdar, A1  Sarma B. K. Vrudhula, PY  1995 VL  44 JA  IEEE Transactions on Computers ER   
Test length, viewed as waiting time on fault coverage, is analyzed next. We derive expressions for its $\backslash mbi\{pmf\}$ and its probability generating function ($\backslash mbi\{pgf\}$). This allows computation of all the higher order moments. In particular, expressions for mean and variance of test length for any specified fault coverage are derived. This is a considerable enhancement of the state of the art in techniques for predicting test length as a function of fault coverage. It is shown that any moment of test length requires knowledge of all the moments of fault coverage, and hence, its $\backslash mbi\{pmf\}$. For this reason, expressions for approximating its expected value and variance, for user specified error bounds, are also given. A methodology based on these results is outlined. Experiments carried out on several circuits demonstrate that this technique is capable of providing excellent predictions of test length. Furthermore it is shown, as with fault coverage prediction, that estimates of variances can be used to bound average test length quite effectively.
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