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Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois, "BuiltIn Test for Circuits with Scan Based on Reseeding of MultiplePolynomial Linear Feedback Shift Registers," IEEE Transactions on Computers, vol. 44, no. 2, pp. 223233, February, 1995.  
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@article{ 10.1109/12.364534, author = {Sybille Hellebrand and Janusz Rajski and Steffen Tarnick and Srikanth Venkataraman and Bernard Courtois}, title = {BuiltIn Test for Circuits with Scan Based on Reseeding of MultiplePolynomial Linear Feedback Shift Registers}, journal ={IEEE Transactions on Computers}, volume = {44}, number = {2}, issn = {00189340}, year = {1995}, pages = {223233}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.364534}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
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TY  JOUR JO  IEEE Transactions on Computers TI  BuiltIn Test for Circuits with Scan Based on Reseeding of MultiplePolynomial Linear Feedback Shift Registers IS  2 SN  00189340 SP223 EP233 EPD  223233 A1  Sybille Hellebrand, A1  Janusz Rajski, A1  Steffen Tarnick, A1  Srikanth Venkataraman, A1  Bernard Courtois, PY  1995 VL  44 JA  IEEE Transactions on Computers ER   
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