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Tight Lower Bounds on the Detection Probabilities of Single Faults at Internal Signal Lines in Combinational Circuits
December 1994 (vol. 43 no. 12)
pp. 1426-1428

A new technique for estimating a tight lower bound of the detection probabilities for single faults at any internal signal line in a combinational circuit for random testing is presented. This lower bound is calculated from the detection probabilities of all single faults at the primary input lines in a linear time. The technique relies on the relationship between the detection probabilities of dominating and dominated faults in the considered combinational circuit.

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Index Terms:
combinational circuits; fault diagnosis; logic testing; tight lower bounds; detection probabilities; single faults; internal signal lines; combinational circuits; random testing.
Citation:
S.A. Ali, G.R. Redinbo, "Tight Lower Bounds on the Detection Probabilities of Single Faults at Internal Signal Lines in Combinational Circuits," IEEE Transactions on Computers, vol. 43, no. 12, pp. 1426-1428, Dec. 1994, doi:10.1109/12.338103
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