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Testing Iterative Logic Arrays for Sequential Faults with a Constant Number of Patterns
April 1994 (vol. 43 no. 4)
pp. 495-501

Shows that a constant number of test vectors are sufficient for fully testing a k-dimensional ILA for sequential faults if the cell function is bijective. The authors then present an efficient algorithm to obtain such a test sequence. By extending the concept of C-testability and M-testability to sequential faults, the constant-length test sequence can be obtained. A pipelined array multiplier is shown to be C-testable with only 53 test vectors for exhaustively testing the sequential faults.

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Index Terms:
logic testing; sequential circuits; logic arrays; combinatorial circuits; iterative logic arrays; sequential faults; test vectors; ILA; C-testability; M-testability; constant-length test sequence; pipelined array multiplier; iterative logic array; logic testing; sequential fault testing; test pattern generation.
Citation:
Chih-Yuang Su, Cheng-Wen Wu, "Testing Iterative Logic Arrays for Sequential Faults with a Constant Number of Patterns," IEEE Transactions on Computers, vol. 43, no. 4, pp. 495-501, April 1994, doi:10.1109/12.278489
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