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ChihYuang Su, ChengWen Wu, "Testing Iterative Logic Arrays for Sequential Faults with a Constant Number of Patterns," IEEE Transactions on Computers, vol. 43, no. 4, pp. 495501, April, 1994.  
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@article{ 10.1109/12.278489, author = {ChihYuang Su and ChengWen Wu}, title = {Testing Iterative Logic Arrays for Sequential Faults with a Constant Number of Patterns}, journal ={IEEE Transactions on Computers}, volume = {43}, number = {4}, issn = {00189340}, year = {1994}, pages = {495501}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.278489}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
RefWorks Procite/RefMan/Endnote  x  
TY  JOUR JO  IEEE Transactions on Computers TI  Testing Iterative Logic Arrays for Sequential Faults with a Constant Number of Patterns IS  4 SN  00189340 SP495 EP501 EPD  495501 A1  ChihYuang Su, A1  ChengWen Wu, PY  1994 KW  logic testing; sequential circuits; logic arrays; combinatorial circuits; iterative logic arrays; sequential faults; test vectors; ILA; Ctestability; Mtestability; constantlength test sequence; pipelined array multiplier; iterative logic array; logic testing; sequential fault testing; test pattern generation. VL  43 JA  IEEE Transactions on Computers ER   
Shows that a constant number of test vectors are sufficient for fully testing a kdimensional ILA for sequential faults if the cell function is bijective. The authors then present an efficient algorithm to obtain such a test sequence. By extending the concept of Ctestability and Mtestability to sequential faults, the constantlength test sequence can be obtained. A pipelined array multiplier is shown to be Ctestable with only 53 test vectors for exhaustively testing the sequential faults.
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