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S.W. Burns, N.K. Jha, "A Totally SelfChecking Checker for a Parallel Unordered Coding Scheme," IEEE Transactions on Computers, vol. 43, no. 4, pp. 490495, April, 1994.  
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@article{ 10.1109/12.278488, author = {S.W. Burns and N.K. Jha}, title = {A Totally SelfChecking Checker for a Parallel Unordered Coding Scheme}, journal ={IEEE Transactions on Computers}, volume = {43}, number = {4}, issn = {00189340}, year = {1994}, pages = {490495}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.278488}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
RefWorks Procite/RefMan/Endnote  x  
TY  JOUR JO  IEEE Transactions on Computers TI  A Totally SelfChecking Checker for a Parallel Unordered Coding Scheme IS  4 SN  00189340 SP490 EP495 EPD  490495 A1  S.W. Burns, A1  N.K. Jha, PY  1994 KW  error detection codes; logic design; builtin self test; parallel algorithms; selfchecking checker; parallel unordered coding scheme; unidirectional errors; parallel encoding/decoding; information symbols; checkbits; concurrent error detection; TSC checker; errordetecting codes; totally selfchecking checker; transient faults; unordered codes. VL  43 JA  IEEE Transactions on Computers ER   
Bose has developed a parallel unordered coding scheme using only r checkbits for 2/sup r/ information bits. This code can detect all unidirectional errors and requires simple parallel encoding/decoding. The information symbols can be separated from the check symbols. However, the information symbols containing all zeros and all ones need to be transformed to two other information symbols. This allows one to reduce the number of checkbits over Berger code by 1. Since information symbols containing a poweroftwo number of bits are quite common, this coding scheme should become quite popular. The authors describe a modular, economical, and easily testable totally selfchecking (TSC) checker design for the above code. The TSC concept is well known for providing concurrent error detection of transient as well as permanent faults. The design is selftesting with at most only 2r+16 codeword tests. This means that if k is the number of information bits, the size of the codeword test set is only O(log/sub 2/ k). This is the first known TSC checker design for this code.
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