This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Almost Sure Diagnosis of Almost Every Good Element
March 1994 (vol. 43 no. 3)
pp. 295-305

We demonstrate a structure for mutual test among N processing elements. We indicate how this structure might be used to identify the good dice on a semiconductor wafer at a cost below that of current techniques. Under either a digraph or a comparison model, our proposed test structure has the following properties: 1) It is nearly regular. 2) It can be laid out in area O(/spl ominus/(n). 3) In time /spl ominus/(N) and with high probability, all but at most an arbitrarily small fraction of the good elements can be identified. 4) The number of tests or comparisons per element is bounded by a constant. We approximate this constant analytically. The result is a substantial savings over the /spl ominus/(log N) tests per element in regular structures whose purpose is to identify, with high probability, every good element. In contrast with the majority of previous work, our results apply even when less than half of the elements are good.

[1] F. Muradali, "A new procedure for weighted random built-in self test," Ph.D. thesis, Dep. of Elect. Eng., McGill Univ., Montreal, PQ, Canada, Mar. 1990.
[2] F. Preparata, G. Metze, and R. Chien, "On the connection assignment problem of diagnosable systems,"IEEE Trans. Comput., vol. C-16, pp. 848-854, 1967.
[3] L. E. LaForge, K. Huang, and V. K. Agarwal, "Almost sure diagnosis of almost every element, Tech. Rep. 91-R5, McGill Univ., Dep. of Elect. Eng., 12 June 1991 (revised Aug. 31, 1992).
[4] M. H. DeGroot,Probability and Statistics. Reading, MA: Addison-Wesley, 1975.
[5] E. Scheinerman, "Almost sure fault tolerance in random graphs,"SIAM J. Comput., vol. 16, pp. 1124-1134, Dec. 1987.
[6] D.M. Blough, "Fault detection and diagnosis in multiprocessor systems," Ph.D. dissertation, The Johns Hopkins Univ., Baltimore, MD, 1988.
[7] S. Rangarajan, D. Fussell, and M. Malek, "Built-in testing of integrated circuit wafers,"IEEE Trans. Comput., vol. C-39, pp. 195-205, Feb. 1990.
[8] J. D. Ullman,Computational Aspects of VLSI. Rockville, MD: Computer Science Press, 1984.
[9] B. Nadeau-Dostie, P.S. Wilcox, and V.K. Agarwal, "A Scan-Based BIST Technique Using Pair-Wise Compare of Identical Components,"Proc. Fourth CSI/IEEE Int'l Symp. on VLSI Design, IEEE, 1991, pp. 225-230.
[10] T. Leighton and C. E. Leiserson, "Wafer-scale integration of systolic arrays,"IEEE Trans. Comput., vol. C-34, pp. 448-461, May 1985.
[11] B. Bollobás,Graph Theory. New York: Springer-Verlag, 1985.
[12] D. S. Mitrinovic´,Analytic Inequalities. Berlin: Springer-Verlag, 1970.
[13] A. V. Aho, J. E. Hopcroft, and J. D. Ullman,The Design and Analysis of Computer Algorithms. Menlo Park, CA: Addison-Wesley, 1974.
[14] W. J. McClean, Ed., "Status 1988: A report on the integrated circuit industry," Integrated Circuit Engineering Corp., Scottsdale, AZ, 1989.
[15] M. B. Ketchen, "Point-defect model for wafer scale integration,"IEEE Circuits Devices Mag., vol. XX, pp. 24-34, July 1987.
[16] L. F. LaForge, "Fault tolerant arrays," Ph.D. thesis, School of Comput, Sci., McGill Univ., Montreal, PQ, Canada, May 1991.

Index Terms:
circuit reliability; logic testing; directed graphs; almost sure diagnosis; almost every good element; mutual test; processing elements; semiconductor wafer; digraph; comparison model.
Citation:
L.E. La Forge, Kaiyuan Huang, V.K. Agarwal, "Almost Sure Diagnosis of Almost Every Good Element," IEEE Transactions on Computers, vol. 43, no. 3, pp. 295-305, March 1994, doi:10.1109/12.272430
Usage of this product signifies your acceptance of the Terms of Use.