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| M.G. Karpovsky, L.B. Levitin, F.S. Vainstein, "Diagnosis by Signature Analysis of Test Responses," IEEE Transactions on Computers, vol. 43, no. 2, pp. 141-152, February, 1994. | |||
| BibTex | x | ||
| @article{ 10.1109/12.262119, author = {M.G. Karpovsky and L.B. Levitin and F.S. Vainstein}, title = {Diagnosis by Signature Analysis of Test Responses}, journal ={IEEE Transactions on Computers}, volume = {43}, number = {2}, issn = {0018-9340}, year = {1994}, pages = {141-152}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.262119}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Diagnosis by Signature Analysis of Test Responses IS - 2 SN - 0018-9340 SP141 EP152 EPD - 141-152 A1 - M.G. Karpovsky, A1 - L.B. Levitin, A1 - F.S. Vainstein, PY - 1994 KW - logic testing; fault tolerant computing; parallel processing; fault location; signature analysis; test responses; faulty processing elements; compressed test response; space-time signature; array processors; hard decision decoding; space-time compression. VL - 43 JA - IEEE Transactions on Computers ER - | |||
Proposes a new approach for identification of faulty processing elements based on an analysis of the compressed test response of the system. The test response is compressed first in space and then in time, and faulty processing elements are identified by hard decision decoding of the corresponding space-time signature. The approach results in considerable savings in hardware required for diagnostics.
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