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Diagnosis by Signature Analysis of Test Responses
February 1994 (vol. 43 no. 2)
pp. 141-152

Proposes a new approach for identification of faulty processing elements based on an analysis of the compressed test response of the system. The test response is compressed first in space and then in time, and faulty processing elements are identified by hard decision decoding of the corresponding space-time signature. The approach results in considerable savings in hardware required for diagnostics.

[1] J. E. Smith, "Measures of the effectiveness of fault signature analysis,"IEEE Trans. Comput., vol. C-29, pp. 510-516, 1980.
[2] W. H. McAnney and J. Savir, "There is information in faulty signatures,"Proc. Int. Test Conf., 1987, pp. 630-636.
[3] J. Savir and W.H. McAnney, "Identification of Failing Tests with Cycling Registers,"Proc. Int'l Test Conf., 1988, pp. 322- 328.
[4] B. Koenemann, J. Mucha, and G. Ziehoff, "Built-in test for complex digital integrated circuits,"IEEE J. Solid State Circuits, vol. SC-15, pp. 315-319, 1980.
[5] S. J. Upadhyaya and K. K. Saluja, "Signature techniques in fault detection," inSpectral Techniques and Fault Detection, G. Karpovsky, Ed. New York: Academic, 1985, pp. 421-477.
[6] P. H. Bardell and W. H. McAnney, "Self-testing of multichip logic modules," inProc. Int. Test Conf., 1982, pp. 200-204.
[7] T. W. Williams, W. Daehn, M. Gruetzner, and C. W. Starke, "Bounds and analysis of aliasing errors in linear-feedback shift-registers,"IEEE Trans. Comput-Aided Design, vol. CAD-7, pp. 75-83, Jan. 1988.
[8] A. Ivanov and V. K. Agarwal, "An analysis of the probabilistic behavior of linear feedback signature registers,"IEEE Trans. Comput.-Aided Design, vol. 8, pp. 1074-1088, Oct. 1989.
[9] D. K. Pradhan, S. K. Gupta, and M. G. Karpovsky, "Aliasing probability for multiple input signature analyzer,"IEEE Trans. Comput., Apr. 1980.
[10] S. R. Reddy, K. K. Saluja, and M. G. Karpovsky, "A data compression for built-in self test,"IEEE Trans. Comput., vol. C-37, pp. 1151-1156, Sept. 1988.
[11] M. G. Karpovsky and P. Nagvajara, "Board level diagnosis,"Proc. Int. Test Conf., 1988, pp. 47-53.
[12] M. Karpovsky and P. Nagvajara, "Design of Built-In Self-Diagnostic Boards,"IEEE Trans. Industrial Electronics, Vol. 36, No. 2, May 1989, pp. 241-245.
[13] M. G. Karpovsky, "An approach for error detection and error correction in distributed systems computing numerical functions,"IEEE Trans. Comput., vol. C-30. pp. 947-954. Dec. 1981.
[14] K. Hwang and F. A. Briggs,Computer Architecture and Parallel Processing. New York: McGraw-Hill, 1984.
[15] M. G. Karpovsky, L. B. Levitin, F. S. Vainstein, "Identification of faulty processing elements by space-time compression of test responses,"Proc. Int. Test Conf., 1990.
[16] I. Koren, "A reconfigurable and fault-tolerant VLSI multiprocessor array," inProc. 8th Int. Symp. Comput. Architecture, Minneapolis, MN, May 1981, pp. 425-442.
[17] I. A. Koren and I. Pomerantz, "Distributed structuring of processor arrays in the presence of faulty processors," inSystolic Arrays. New York: Adam Higler, 1986.
[18] S.Y. Kung,VLSI Array Processors, Prentice Hall, Englewood Cliffs, N.J. 1988.
[19] M. G. Karpovsky and S. M. Chaudhry, "Built-in self-diagnostic by space-time compression," inProc. IEEE VLSI Test Symp., 1992.
[20] D. K. Pradhan, "Developing a standard for boundary-scan implementations," inProc. IEEE Int. Conf. Comput. Des., 1987, pp. 462-466.

Index Terms:
logic testing; fault tolerant computing; parallel processing; fault location; signature analysis; test responses; faulty processing elements; compressed test response; space-time signature; array processors; hard decision decoding; space-time compression.
Citation:
M.G. Karpovsky, L.B. Levitin, F.S. Vainstein, "Diagnosis by Signature Analysis of Test Responses," IEEE Transactions on Computers, vol. 43, no. 2, pp. 141-152, Feb. 1994, doi:10.1109/12.262119
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