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J. Rajski, J. Tyszer, "Recursive Pseudoexhaustive Test Pattern Generation," IEEE Transactions on Computers, vol. 42, no. 12, pp. 15171521, December, 1993.  
BibTex  x  
@article{ 10.1109/12.260644, author = {J. Rajski and J. Tyszer}, title = {Recursive Pseudoexhaustive Test Pattern Generation}, journal ={IEEE Transactions on Computers}, volume = {42}, number = {12}, issn = {00189340}, year = {1993}, pages = {15171521}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.260644}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
RefWorks Procite/RefMan/Endnote  x  
TY  JOUR JO  IEEE Transactions on Computers TI  Recursive Pseudoexhaustive Test Pattern Generation IS  12 SN  00189340 SP1517 EP1521 EPD  15171521 A1  J. Rajski, A1  J. Tyszer, PY  1993 KW  builtin self test; logic testing; recursive pseudoexhaustive test pattern generation; characteristic functions; test vectors; parallel pattern generator; exclusiveor array; serial generators; scanbased builtin selftest. VL  42 JA  IEEE Transactions on Computers ER   
A recursive technique for generating exhaustive patterns is presented. The method is optimal, i.e., in one experiment it covers exhaustively every block of k adjacent inputs in the first 2/sup k/ vectors. Implementation methods based on characteristic functions of test vectors are provided. They include a parallel pattern generator employing an exclusiveor array, and two serial generators that can be easily adopted in a scanbased builtin selftest environment.
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