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Recursive Pseudoexhaustive Test Pattern Generation
December 1993 (vol. 42 no. 12)
pp. 1517-1521

A recursive technique for generating exhaustive patterns is presented. The method is optimal, i.e., in one experiment it covers exhaustively every block of k adjacent inputs in the first 2/sup k/ vectors. Implementation methods based on characteristic functions of test vectors are provided. They include a parallel pattern generator employing an exclusive-or array, and two serial generators that can be easily adopted in a scan-based built-in self-test environment.

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Index Terms:
built-in self test; logic testing; recursive pseudoexhaustive test pattern generation; characteristic functions; test vectors; parallel pattern generator; exclusive-or array; serial generators; scan-based built-in self-test.
J. Rajski, J. Tyszer, "Recursive Pseudoexhaustive Test Pattern Generation," IEEE Transactions on Computers, vol. 42, no. 12, pp. 1517-1521, Dec. 1993, doi:10.1109/12.260644
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