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T.P. Kelsey, K.K. Saluja, S.Y. Lee, "An Efficient Algorithm for Sequential Circuit Test Generation," IEEE Transactions on Computers, vol. 42, no. 11, pp. 13611371, November, 1993.  
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@article{ 10.1109/12.247839, author = {T.P. Kelsey and K.K. Saluja and S.Y. Lee}, title = {An Efficient Algorithm for Sequential Circuit Test Generation}, journal ={IEEE Transactions on Computers}, volume = {42}, number = {11}, issn = {00189340}, year = {1993}, pages = {13611371}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.247839}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
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TY  JOUR JO  IEEE Transactions on Computers TI  An Efficient Algorithm for Sequential Circuit Test Generation IS  11 SN  00189340 SP1361 EP1371 EPD  13611371 A1  T.P. Kelsey, A1  K.K. Saluja, A1  S.Y. Lee, PY  1993 KW  sequential circuit test generation; automatic test generation algorithm; PODEM; ninevalued logic model; Initial Timeframe Algorithm; Previous State Information Problem; faulty machine states; automatic testing; logic testing; sequential circuits. VL  42 JA  IEEE Transactions on Computers ER   
This paper presents an efficient sequential circuit automatic test generation algorithm. The algorithm is based on PODEM and uses a ninevalued logic model. Among the novel features of the algorithm are use of Initial Timeframe Algorithm and correct implementation of a solution to the Previous State Information Problem. The Initial Timeframe Algorithm, one of the most important aspects of the test generator, determines the number of timeframes required to excite the fault for which a test is to be derived and the number of timeframes required to observe the excited fault. Correct determination of the number of timeframes in which the fault should be excited (activated) and observed saves the test generator from performing unnecessary search in the input space. Test generation is unidirectional, i.e., it is done strictly in forward time, and flipflops in the initial timeframe are never assigned a state that needs to be justified later. The algorithm saves both the good and the faulty machine states after finding a test to aid in subsequent test generation. The Previous State Information Problem, which has often been ignored by existing test generators, is presented and discussed in the paper. Experimental results are presented to demonstrate the effectiveness of the algorithm.
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