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J. Ortega, A.L. Ruiz, A. Prieto, F.J. Pelayo, "TestPattern Generation Based on ReedMuller Coefficients," IEEE Transactions on Computers, vol. 42, no. 8, pp. 968980, August, 1993.  
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@article{ 10.1109/12.238487, author = {J. Ortega and A.L. Ruiz and A. Prieto and F.J. Pelayo}, title = {TestPattern Generation Based on ReedMuller Coefficients}, journal ={IEEE Transactions on Computers}, volume = {42}, number = {8}, issn = {00189340}, year = {1993}, pages = {968980}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.238487}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
RefWorks Procite/RefMan/Endnote  x  
TY  JOUR JO  IEEE Transactions on Computers TI  TestPattern Generation Based on ReedMuller Coefficients IS  8 SN  00189340 SP968 EP980 EPD  968980 A1  J. Ortega, A1  A.L. Ruiz, A1  A. Prieto, A1  F.J. Pelayo, PY  1993 KW  test pattern generation; ReedMuller coefficients; testpattern selection procedure; single stuckat faults; heuristics; spectral coefficients; combinational circuits; patterngenerating procedure; complexity; benchmark circuits; ALU 74181; computational complexity; logic testing. VL  42 JA  IEEE Transactions on Computers ER   
ReedMuller coefficients are used to generate a testpattern selection procedure for detecting single stuckat faults. This procedure is based on the heuristics deduced from the way in which the spectral coefficients are affected by such faults. The changes that the spectral coefficients undergo are also compared with the fault models used most frequently to model defects in combinational circuits. The proposed patterngenerating procedure does not need a simulation of the circuit for each of the possible stuckat faults, and its complexity is proportional to the number of gates in the circuit. The proportionality constant increases exponentially as the number of inputs in the circuit increases. To evaluate the performance of the proposed method, its application to some benchmark circuits, including the ALU 74181, is presented.
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