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Issue No.07 - July (1993 vol.42)
pp: 887-891
ABSTRACT
<p>The pseudoexhaustive testing (PET) scheme is an economical approach to testing a large embedded programmable logic array (PLA). The authors propose an efficient algorithm named low overhead PET (LOPET) to partition the product lines. By applying this algorithm, both the area overhead and test length are reduced significantly.</p>
INDEX TERMS
pseudoexhaustive testable PLA; large embedded programmable logic array; low overhead PET; product lines; area overhead; test length; built-in self test; design for testability; logic arrays; logic testing.
CITATION
W.-Z. Shen, G.-H. Hwang, W.-J. Hsu, Y.-J. Jan, "Design of Pseudoexhaustive Testable PLA with Low Overhead", IEEE Transactions on Computers, vol.42, no. 7, pp. 887-891, July 1993, doi:10.1109/12.237730
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