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V. Raghavan, "On Asymmetric Invalidation with Partial Tests," IEEE Transactions on Computers, vol. 42, no. 6, pp. 764768, June, 1993.  
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@article{ 10.1109/12.277298, author = {V. Raghavan}, title = {On Asymmetric Invalidation with Partial Tests}, journal ={IEEE Transactions on Computers}, volume = {42}, number = {6}, issn = {00189340}, year = {1993}, pages = {764768}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.277298}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
RefWorks Procite/RefMan/Endnote  x  
TY  JOUR JO  IEEE Transactions on Computers TI  On Asymmetric Invalidation with Partial Tests IS  6 SN  00189340 SP764 EP768 EPD  764768 A1  V. Raghavan, PY  1993 KW  asymmetric invalidation; partial tests; fault diagnosis; diagnosability problem; coNP complete; diagnosis algorithm; computational complexity; logic testing. VL  42 JA  IEEE Transactions on Computers ER   
R. Gupta and I.V. Ramakrishnan (1987) proposed a general model for fault diagnosis that uniformly handles intermittent faults, masking, and partial testing. In this model, the diagnosability problem is open if asymmetric invalidation is used, although a polynomial time algorithm was once incorrectly claimed. It is shown that the problem is really coNP complete. An efficient diagnosis algorithm for this model is presented.
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