This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
A Unified Negative-Dinomial Distribution for Yield Analysis of Defect-Tolerant Circuits
June 1993 (vol. 42 no. 6)
pp. 724-734

It has been recognized that the yield of fault-tolerant VLSI circuits depends on the size of the fault clusters. Consequently, models for yield analysis have been proposed for large-area clustering and small-area clustering, based on the two-parameter negative-binomial distribution. The addition of a new parameter, the block size, to the two existing parameters of the fault distribution is proposed. This parameter allows the unification of the existing models and, at the same time, adds a whole range of medium-size clustering models. Thus, the flexibility in choosing the appropriate yield model is increased. Methods for estimating the newly defined block size are presented and the approach is validated through simulation and empirical data.

[1] J. A. Cunningham, "The use and evaluation of yield models in integrated circuit manufacturing,"IEEE Trans. Semiconduct. Manufact., vol. 3, no. 2, pp. 60-71, May 1990.
[2] I. Koren and C. H. Stapper, "Yield models for defect tolerant VLSI circuit: a review,"Defect and Fault Tolerance in VLSI Systems, vol. 1, I. Koren, Ed. New York: Plenum, 1989, pp. 1-21.
[3] C. H. Stapper, "Small-area fault clusters and fault tolerance in VLSI circuits,"IBM J. Res. Develop., vol. 33, pp. 174-177, Mar. 1989.
[4] F. J. Meyer and D. K. Pradhan, "Modeling defect spatial distribution,"IEEE Trans. Comput., vol. 38, pp. 538-546, Apr. 1989.
[5] E. I. Muehldorf, "Fault clustering: modeling and observation on experimental LSI chips,"IEEE J. Solid-State Circuits, vol. SC-10, pp. 237-244, Aug. 1975.
[6] Z. Zhongxuan and L. Zhijian, "Effect of defect clustering on VLSI yield statistics and statistical parameters as a function of chip area,"Chinese J. Semiconductors, vol. 9, no. 2, pp. 167-179.
[7] Z. Koren and I. Karen, "A unified approach for yield analysis of defect tolerant circuits,"Defect and Fault Tolerance in VLSI Systems, vol. 2, C. H. Stapper, V. K. Jain, and G. Saucier, Eds. New York: Plenum, 1990, pp. 33-45.
[8] I. Koren, Z. Koren, and C. H. Stapper, "Employing the unified negative binomial distribution for yield analysis of empirical data," inProc. 1990 IEEE Int. Workshop Defect Fault Tolerance VLSI Syst.(Grenoble, France), Nov. 1990, pp. 34-46.
[9] V. F. Flack, "Estimating variations in IC yield estimates,"IEEE J. Solid-State Circuits, vol. SC-21, pp. 362-365, Apr. 1986.
[10] C. H. Stapper, "Correlation analysis of particle clusters on integrated circuit wafers,"IBM J. Res. Develop., vol. 31, pp. 641-650, Nov. 1987.

Index Terms:
negative-binomial distribution; yield analysis; yield; fault-tolerant VLSI; fault clusters; fault distribution; circuit reliability; fault tolerant computing; redundancy; statistical analysis; VLSI.
Citation:
I. Koren, Z. Koren, C.H. Stepper, "A Unified Negative-Dinomial Distribution for Yield Analysis of Defect-Tolerant Circuits," IEEE Transactions on Computers, vol. 42, no. 6, pp. 724-734, June 1993, doi:10.1109/12.277291
Usage of this product signifies your acceptance of the Terms of Use.