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A Unified Negative-Dinomial Distribution for Yield Analysis of Defect-Tolerant Circuits
June 1993 (vol. 42 no. 6)
pp. 724-734

It has been recognized that the yield of fault-tolerant VLSI circuits depends on the size of the fault clusters. Consequently, models for yield analysis have been proposed for large-area clustering and small-area clustering, based on the two-parameter negative-binomial distribution. The addition of a new parameter, the block size, to the two existing parameters of the fault distribution is proposed. This parameter allows the unification of the existing models and, at the same time, adds a whole range of medium-size clustering models. Thus, the flexibility in choosing the appropriate yield model is increased. Methods for estimating the newly defined block size are presented and the approach is validated through simulation and empirical data.

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Index Terms:
negative-binomial distribution; yield analysis; yield; fault-tolerant VLSI; fault clusters; fault distribution; circuit reliability; fault tolerant computing; redundancy; statistical analysis; VLSI.
I. Koren, Z. Koren, C.H. Stepper, "A Unified Negative-Dinomial Distribution for Yield Analysis of Defect-Tolerant Circuits," IEEE Transactions on Computers, vol. 42, no. 6, pp. 724-734, June 1993, doi:10.1109/12.277291
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