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The Minimal Test Set for Multioutput Threshold Circuits Implemented as Sorting Networks
June 1993 (vol. 42 no. 6)
pp. 700-712

It is shown that an n-input sorting network (SN) can be used to implement an n-variable symmetric threshold functions using the least amount of hardware. An algorithm to derive Boolean functions implemented on any line of any n-input threshold circuit T/sup n/ implemented as a SN is given. A heuristic procedure for generating the minimal test set for any threshold circuit T/sup n/ implemented as a Batcher's SN or any other SN is presented. The number of tests required to detect all stuck-at faults in an n-input SN is determined. A highly regular structure using only one type of simple cell and a suitability for low-level pipelining are other advantages of the circuit T/sup n/. The circuit T/sup n/ can be used as a basic building block of various circuitry supporting the use of all known unidirectional error detecting codes.

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Index Terms:
minimal test set; multioutput threshold circuits; sorting networks; n-input; symmetric threshold functions; Boolean functions; threshold circuit; unidirectional error detecting codes; Boolean functions; logic circuits; logic testing; threshold logic.
S.J. Piestrak, "The Minimal Test Set for Multioutput Threshold Circuits Implemented as Sorting Networks," IEEE Transactions on Computers, vol. 42, no. 6, pp. 700-712, June 1993, doi:10.1109/12.277288
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