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D.M. Blough, A. Pelc, "A Clustered Failure Model for the Memory Array Reconfiguration Problem," IEEE Transactions on Computers, vol. 42, no. 5, pp. 518528, May, 1993.  
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@article{ 10.1109/12.223671, author = {D.M. Blough and A. Pelc}, title = {A Clustered Failure Model for the Memory Array Reconfiguration Problem}, journal ={IEEE Transactions on Computers}, volume = {42}, number = {5}, issn = {00189340}, year = {1993}, pages = {518528}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.223671}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
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TY  JOUR JO  IEEE Transactions on Computers TI  A Clustered Failure Model for the Memory Array Reconfiguration Problem IS  5 SN  00189340 SP518 EP528 EPD  518528 A1  D.M. Blough, A1  A. Pelc, PY  1993 KW  clustered failure model; memory array reconfiguration problem; spare rows; spare columns; yield enhancement; centersatellite approach; approximation algorithm; probabilistic model; configuration management; fault tolerant computing; memory architecture; probability. VL  42 JA  IEEE Transactions on Computers ER   
Reconfiguration of memory array using spare rows and spare columns, which has been shown to be a useful technique for yield enhancement of memories, is considered. A clustered failure model that adopts the centersatellite approach of F.J. Meyer and D.K. Pradhan (1989) is proposed and utilized to show that the total number of faulty cells that can be tolerated when clustering occurs is larger than when faults are independent. It is also shown that an optimal solution to the reconfiguration problem can be found in polynomial time for a special case of the clustering model. An efficient approximation algorithm is given for the general case of the probabilistic model assumed. It is shown, through simulation, that the computation time required by this algorithm to repair large arrays containing a significant number of clustered faults is small.
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