
This Article  
 
Share  
Bibliographic References  
Add to:  
Digg Furl Spurl Blink Simpy Del.icio.us Y!MyWeb  
Search  
 
ASCII Text  x  
A.K. Das, P.P. Chaudhuri, "Vector Space Theoretic Analysis of Additive Cellular Automata and its Application for Pseudoexhaustive Test Pattern Generation," IEEE Transactions on Computers, vol. 42, no. 3, pp. 340352, March, 1993.  
BibTex  x  
@article{ 10.1109/12.210176, author = {A.K. Das and P.P. Chaudhuri}, title = {Vector Space Theoretic Analysis of Additive Cellular Automata and its Application for Pseudoexhaustive Test Pattern Generation}, journal ={IEEE Transactions on Computers}, volume = {42}, number = {3}, issn = {00189340}, year = {1993}, pages = {340352}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.210176}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
RefWorks Procite/RefMan/Endnote  x  
TY  JOUR JO  IEEE Transactions on Computers TI  Vector Space Theoretic Analysis of Additive Cellular Automata and its Application for Pseudoexhaustive Test Pattern Generation IS  3 SN  00189340 SP340 EP352 EPD  340352 A1  A.K. Das, A1  P.P. Chaudhuri, PY  1993 KW  additive cellular automata; pseudoexhaustive test pattern generation; vector space; cellular automata; logic testing. VL  42 JA  IEEE Transactions on Computers ER   
A novel scheme for utilizing the regular structure of three neighborhood additive cellular automata (CAs) for pseudoexhaustive test pattern generation is introduced. The vector space generated by a CA can be decomposed into several cyclic subspaces. A cycle corresponding to an mdimensional cyclic subspace has been shown to pseudoexhaustively test an ninput circuit (n
[1] E. J. McCluskey, "Verification testingA pseudoexhaustive test technique,"IEEE Trans Comput., vol. C33, pp. 541546, June 1984.
[2] D. T. Tang and L. S. Woo, "Exhaustive test pattern generation with constant weight vectors,"IEEE Trans. Comput., vol. C32, pp. 11451150, Dec. 1983.
[3] L. Ward and E. J. McCluskey, "Condensed linear feedback shift register (LFSR) testingA pseudo exhaustive test technique,"IEEE Trans. Comput., vol. C35, no. 4, pp. 367370, Apr. 1986.
[4] D. T. Tang and C. L. Chen, "Logic test pattern generation using linear codes,"IEEE Trans. Comput., vol. C33, pp. 845850, Sept. 1984.
[5] L.T. Wang and E. J. McCluskey, "Circuits for pseudoexhaustive test pattern generation,"IEEE Trans. ComputAided Design, vol. CAD7, pp. 10681980, Oct. 1988.
[6] C. L. Chen, "Exhaustive test pattern generation using cyclic codes,"IEEE Trans. Comput., vol. C37, pp. 225228, Feb. 1988.
[7] Z. Barzilai, D. Copersmith, and A. L. Rosenburg, "Exhaustive generation of bit patterns with application to VLSI self testing,"IEEE Trans. Comput., vol. C32, pp. 190194, Feb. 1983.
[8] D. T. Tang and C. L. Chen, "Iterative exhaustive pattern generation for logic testing,"IBM J. Res. Develop., vol. 28, pp. 212219, Mar. 1984.
[9] W. W. Peterson and E. J. Weldon,Error Correcting Codes, 2nd ed. Cambridge, MA: M.I.T. Press, 1972.
[10] S. K. Yap and A. Albicki, "Covering a set of test patterns by a cellular automata," Univ of Rochester Comput. Sci&Eng. Research Review, 19871988.
[11] A. K. Das and P. Pal Chaudhuri, "An efficient deterministic test pattern generation scheme"Euromicro J. Microprocessing and Microprogramming, vol. 26, pp. 195204, 1989.
[12] A. K. Das, M. Pandey, A. Gupta, and P. Pal Chaudhuri, "Builtin selftest structures around cellular automata and counters,"IEE Proc.part (E), vol. 137, p. 268276, July 1990.
[13] A. K. Das, A. Ganguly, A. Dasgupta, S. Bhawmik, and P. Pal Chaudhuri, "Efficient characterization of cellular automata,"IEE Proc., vol. 137, Pt. E, no. 1, pp. 8187, Jan. 1990.
[14] A. K. Das, A. Sanyal, and P. Pal Chaudhuri, "On characterization of cellular automata with matrix algebra,"Inform. Sci., vol. 65, pp. 251277, June 1992.
[15] S. W. Golomb,Shift Register Sequences, rev. ed. Laguna Hills, CA: Aegean Park Press, 1982.
[16] N. Ben,Applied Linear Algebra. Englewood Cliffs, NJ: Prentice Hall, 1969.
[17] F. R. Gantmacher,The Theory of Matrices, Vol. I. New York: Chelsea, 1959.
[18] G. E. Sobelman and C. H. Chen, "An efficient approach to pseudoexhaustive test generation for BIST design," inProc. ICCD, 1989, pp. 576579.
[19] P. D. Hortensius, R. D. Mcleod, W. Pries, D. M. Miller, and H. C. Card, "Cellular automata based pseudorandom number generators for builtin selftest,"IEEE Trans. Comput.Aided Design, vol. 8, no 8, pp. 84259, Aug. 1989.
[20] A. K. Das, "Additive cellular automata: Theory and application as a BuiltIn SelfTest Structure," Ph.D. dissertation, Dep. Comput. Sci. Eng., Indian Institute of Technology, Kharagpur, 1990.
[21] P.D. Hortensius, R.D. McLeod, and B.W. Podaima, "Cellular Automata Circuits for BuiltIn SelfTest,"IBM J. Research and Development, Vol. 34, No. 213, Mar./ May 1990, pp. 389405.
[22] P. D. Hortensius, R. D. McLeod, and H. C. Card, "Cellular Automatabased signature analyzer for builtin selftest,"IEEE Trans. Comput., vol. 39, no. 10, pp. 12731283, Oct. 1990.
[23] B. Mitra, S. Mishra, and P. Pal Chaudhuri, "A system for synthesis of sequential machines with BuiltIn Testability," inProc. CICC '91, pp. 11.4.111.4.4.
[24] B. Mitra, P.R. Panda, and P. Pal Chaudhuri, "A flexible scheme for state assignment based on characteristics of the FSM," inProc. ICCAD '91, pp. 226229.
[25] M. Serraet al., "The analysis of onedimensional linear cellular automata and their aliasing properties,"IEEE Trans. Comput.Aided Design, vol. 9, pp. 767778, July 1990.
[26] A. K. Das, S. Saha, A. Roy Chowdhury, S. Misra, and P. Pal Chaudhuri, "Signature analyzer based on additivecellular automata," inProc. 20th Fault Tolerant Computing Syst., pp. 265272, U.K., June 1990.