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IEEE Transactions on Computers
May 1992 (vol. 41 no. 5)
ISSN: 0018-9340
Table of Contents
Foreword
Foreword
(Abstract)
W.K. Fuchs
pp. 513-514
ABSTRACT
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Dedication to W.N. Toy
Dedication to W.N. Toy
(Abstract)
pp. 515
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PAPERS
Virtual Checkpoints: Architecture and Performance
(Abstract)
N.S. Bowen
D.K. Pradhan
pp. 516-525
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Manetho: Transparent Roll Back-Recovery with Low Overhead, Limited Rollback, and Fast Output Commit
(Abstract)
E.N. Elnozahy
W. Zwaenepoel
pp. 526-531
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Probabilistic Evaluation of Online Checks in Fault-Tolerant Multiprocessor Systems
(Abstract)
V.S.S. Nair
Y.V. Hoskote
J.A. Abraham
pp. 532-541
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Principal Features of the VOLTAN Family of Reliable Node Architectures for Distributed Systems
(Abstract)
S.K. Shrivastava
P.D. Ezhilchelvan
N.A. Speirs
S. Tao
A. Tully
pp. 542-549
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Estimation and Enhancement of Real-Time Software Reliability Through Mutation Analysis
(Abstract)
R. Geist
A.J. Offutt
F.C. Harris, Jr.
pp. 550-558
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Observations on the Effects of Fault Manifestation as a Function of Workload
(Abstract)
E.W. Czeck
D.P. Siewiorek
pp. 559-566
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Analysis and Modeling of Correlated Failures in Multicomputer Systems
(Abstract)
D. Tang
R.K. Iyer
pp. 567-577
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Fast Algorithms for Routing Around Faults in Multibutterflies and Randomly-Wired Splitter Networks
(Abstract)
F.T. Leighton
B.M. Maggs
pp. 578-587
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Some Practical Issues in the Design of Fault-Tolerant Multiprocessors
(Abstract)
S. Dutt
J.P. Hayes
pp. 588-598
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Tolerating Faults in Hypercubes Using Subcube Partitioning
(Abstract)
J. Bruck
R. Cypher
D. Soroker
pp. 599-605
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Diagnosing Arbitrarily Connected Parallel Computers with High Probability
(Abstract)
S. Rangarajan
D. Fussell
pp. 606-615
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Implementation of Online Distributed System-Level Diagnosis Theory
(Abstract)
R.P. Bianchini, Jr.
R.W. Buskens
pp. 616-626
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The Multiple Observation Time Test Strategy
(Abstract)
I. Pomeranz
S.M. Reddy
pp. 627-637
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Simple Bounds on Serial Signature Analysis Aliasing for Random Testing
(Abstract)
N.R. Saxena
P. Franco
E.J. McCluskey
pp. 638-645
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An Effective BIST Scheme for ROM's
(Abstract)
Y. Zorian
A. Ivanov
pp. 646-653
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A Testable Design of Logic Circuits Under Highly Observable Condition
(Abstract)
W. Xiaoqing
K. Kinoshita
pp. 654-659
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