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Symbol Error-Correcting Codes for Computer Memory Systems
February 1992 (vol. 41 no. 2)
pp. 252-256

A method is presented of constructing symbol error correcting codes that have a minimum symbol distance of 4. The method yields some codes that are more efficient than previously known codes. The application is to designing fault-tolerant semiconductor memories.

[1] C. L. Chen and M. Y. Hsiao, "Error-correcting codes for semiconductor memory applications: A state-of-the-art-review,"IBM J. Res. Develop., vol. 28, no. 2, pp. 124-134, Mar. 1984.
[2] B. Santo, "Technology '89: Solid state,"IEEE Spectrum, vol. 26, no. 1, pp. 47-48, Jan. 1989.
[3] B. Pascoe, "2107A/2107B N-channel silicon gate MOS 4K RAMs," Reliability Rep. RR-7, Intel Corp., Santa Clara, CA, Sept. 1975.
[4] C. H. Stapper, A. N. McLaren, and M. Dreckmann, "Yield model for productivity optimization of VLSI memory chips with redundancy and partially good product,"IBM J. Res. Develop., vol. 24, no. 3, pp. 398-409, May 1980.
[5] S. Kaneda and H. Fukuda, "Reliability design of memory systems considering soft error,"Syst. and Comput. in Japan, vol. 17, no. 2, pp. 1-11, 1986.
[6] W. F. Mikhail, R. W. Bartoldus, and R. A. Rutledge, "The reliability of memory with single-error correction,"IEEE Trans. Comput., vol. C-31, pp. 560-564, June 1982.
[7] W. W. Peterson and E. J. Weldon, Jr.,Error-Correcting Codes, second ed. Cambridge, MA: MIT Press, 1972.
[8] T. Kasami, S. Lin, and W. W. Peterson, "Some results on cyclic codes which are invariant under the affine group and their applications,"Inform. Contr., vol. 11, pp. 475-496, Nov. 1967.
[9] J. K. Wolf, "Adding two information symbols to certain nonbinary BCH codes and some applications,"Bell Syst. Tech. J., vol. 48, pp. 1405-2424, Sept. 1969.
[10] C. L. Chen, "Error-correcting codes for byte-organized memory systems,"IEEE Trans. Inform. Theory, vol. IT-32, no. 2, Mar. 1986.
[11] S. Kaneda and E. Fujiwara, "Single byte error correcting double byte error detecting codes for memory systems,"IEEE Trans. Comput., vol. C-31, pp. 596-602, July 1982.
[12] C. L. Chen and R. A. Rutledge, "Fault-tolerant memory simulator,"IBM J. Res. Develop., vol. 28, pp. 184-195, Mar. 1984.

Index Terms:
computer memory systems; symbol error correcting codes; symbol distance; fault-tolerant semiconductor memories; error correction codes; semiconductor storage.
C.L. Chen, "Symbol Error-Correcting Codes for Computer Memory Systems," IEEE Transactions on Computers, vol. 41, no. 2, pp. 252-256, Feb. 1992, doi:10.1109/12.123405
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