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Statistical Resistance to Detection (Digital Circuits Testing)
January 1992 (vol. 41 no. 1)
pp. 123-126

Discusses the problem of estimating the sum of the detection probabilities of the yet unobserved faults during a random pattern test of a given digital circuit. The authors describe a statistical method for this purpose. The method requires keeping track of each fault until it is detected for the second time, and thus the simulation cost is about twice the cost of a similar simulation which abandons faults after their first detect. The benefits of having an estimate of the sum of these detection probabilities are twofold: (1) it provides a good stopping rule whenever 100% fault coverage is infeasible (which is often the case), and (2) it provides an estimate of the required effort to detect the next fault. The results of tests performed on some circuits are presented.

[1] P. H. Bardell, W. H. McAnney, and J. Savir,Built-In Test for VLSI: Pseudorandom Techniques. New York: Wiley, 1987.
[2] P. J. Bickel and J. A. Yahav, "On estimating the number of unseen species: How many executions were there?," Tech. Rep. 85, Dep. of Statistics, Univ. of Calif. Berkeley, CA, June 1985.
[3] B. Efron and R. Thisted, "Estimating the number of unseen species: How many words did Shakespeare know?,"Biometrica, vol. 63, no. 3, pp. 435-447, 1976.
[4] H. E. Robbins, "Estimating the total probability of the unobserved outcomes of an experiment,"Ann. Math. Statist., vol. 39, no. 1, pp. 256-257, 1968.
[5] F. Brglez, P. Pownall, and R. Hum, "Accelerated ATPG and fault grading via testability analysis," inProc. ISCAS, 1985, pp. 695-698.
[6] I. J. Good and G. H. Toulmin, "The number of new species and the increase in population coverage when a sample is increased,"Biometrica, vol. 43, pp. 45-63, 1956.
[7] L. A. Goodman, "On the estimation of the number of classes in a population,"Ann. Math. Statist., vol. 20, pp. 572-579, 1949.

Index Terms:
digital circuits testing; detection probabilities; random pattern test; digital circuit; statistical method; simulation cost; fault coverage; automatic testing; digital circuits; fault location; integrated circuit testing; logic testing.
Citation:
A. Boneh, J. Savir, "Statistical Resistance to Detection (Digital Circuits Testing)," IEEE Transactions on Computers, vol. 41, no. 1, pp. 123-126, Jan. 1992, doi:10.1109/12.123388
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