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| J. Savir, W.H. McAnney, S.R Vecchio, "Testing for Coupled Cells in Random-Access Memories," IEEE Transactions on Computers, vol. 40, no. 10, pp. 1177-1180, October, 1991. | |||
| BibTex | x | ||
| @article{ 10.1109/12.93752, author = {J. Savir and W.H. McAnney and S.R Vecchio}, title = {Testing for Coupled Cells in Random-Access Memories}, journal ={IEEE Transactions on Computers}, volume = {40}, number = {10}, issn = {0018-9340}, year = {1991}, pages = {1177-1180}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.93752}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - JOUR JO - IEEE Transactions on Computers TI - Testing for Coupled Cells in Random-Access Memories IS - 10 SN - 0018-9340 SP1177 EP1180 EPD - 1177-1180 A1 - J. Savir, A1 - W.H. McAnney, A1 - S.R Vecchio, PY - 1991 KW - RAM; random-access memories; memory testing; coupled-cell faults; address lines; read/write control; address space; deterministic setting; automatic testing; fault tolerant computing; integrated circuit testing; integrated memory circuits; random-access storage. VL - 40 JA - IEEE Transactions on Computers ER - | |||
Two test strategies for memory testing are compared for their ability to detect coupled-cell faults in an n-word-by-1-bit random access memory. In both strategies the data-in line is randomly driven. One of the two strategies uses random selection of both the address lines and the read/write control. The other strategy sequentially cycles through the address space with deterministic setting of the read/write control. The relative merit of the two strategies is measured by the average number of accesses per address needed to meet a standard test quality level.
[1] A. Fuentes, R. David, and B. Courtois, "Random testing versus deterministic testing of RAM's," inDig. Papers, Fault-Tolerant Comput. Symp. (FTCS-16), Vienna, Austria, July 1986, pp. 266-271.
[2] R. David, A Fuentes, and B. Courtois, "Random pattern testing versus deterministic testing of RAM's,"IEEE Trans. Comput., vol. 38, pp. 637-650, May 1989.
[3] J. Savir, W. H. McAnney, and S. R. Vecchio, "Testing for coupled cells in random-access memories," inProc. 1989 Int. Test Conf., Aug. 1989, pp. 439-451.