Issue No.07 - July (1991 vol.40)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.83624
<p>An attempt is made to demonstrate that the problem of complete test set generation is amenable to the problem of pseudo-Boolean programming. For this purpose, various types of faults, viz., single faults, multiple faults, and bridging faults, are considered. The key issue is to obtain logical expressions for the primary output line in terms of different faulty internal nodes to find real transforms. Using standard rules, the real transforms of a Boolean function can be obtained directly without any algebraic manipulation.</p>
complete test set generation; pseudo-Boolean programming; logical expressions; real transforms; Boolean function; Boolean functions; formal logic; logic programming; logic testing.
P.R. Bhattacharjee, S.K. Basu, J.C. Paul, "Translation of the Problem of Complete Test Set Generation to Pseudo-Boolean Programming", IEEE Transactions on Computers, vol.40, no. 7, pp. 864-867, July 1991, doi:10.1109/12.83624