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Issue No.11 - November (1990 vol.39)
pp: 1398-1403
ABSTRACT
<p>A new class of data-compression techniques called group-theoretic signature analysis (GTSA) for testing a logic network is proposed, and the fault coverage of the method is analyzed. This method is a generalization of accumulator compression testing. Built-in-self-test for processor environments is feasible with GTSA.</p>
INDEX TERMS
built-in self-test; data-compression techniques; group-theoretic signature analysis; testing; logic network; fault coverage; accumulator compression testing; processor environments; built-in self test; data compression; logic circuits; logic testing.
CITATION
B. Bose, "Group Theoretic Signature Analysis", IEEE Transactions on Computers, vol.39, no. 11, pp. 1398-1403, November 1990, doi:10.1109/12.61051
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