Issue No.04 - April (1990 vol.39)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/12.54854
<p>A relation between the average fault coverage and circuit testability is developed. The statistical formulation allows computation of coverage for deterministic and random vectors. The following applications of this analysis are discussed: determination of circuit testability from fault simulation, coverage prediction from testability analysis, prediction of test length, and test generation by fault sampling.</p>
deterministic vectors; statistical theory; digital circuit testability; average fault coverage; computation of coverage; random vectors; fault simulation; coverage prediction; test generation; fault sampling; digital circuits; fault location; statistical analysis.
V.D. Agrawal, H. Farhat, S.C. Seth, "A Statistical Theory of Digital Circuit Testability", IEEE Transactions on Computers, vol.39, no. 4, pp. 582-586, April 1990, doi:10.1109/12.54854