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M.F. Chang, W. Shi, W.K. Fuchs, "Optimal Diagnosis Procedures for koutofn Structures," IEEE Transactions on Computers, vol. 39, no. 4, pp. 559564, April, 1990.  
BibTex  x  
@article{ 10.1109/12.54850, author = {M.F. Chang and W. Shi and W.K. Fuchs}, title = {Optimal Diagnosis Procedures for koutofn Structures}, journal ={IEEE Transactions on Computers}, volume = {39}, number = {4}, issn = {00189340}, year = {1990}, pages = {559564}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.54850}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
RefWorks Procite/RefMan/Endnote  x  
TY  JOUR JO  IEEE Transactions on Computers TI  Optimal Diagnosis Procedures for koutofn Structures IS  4 SN  00189340 SP559 EP564 EPD  559564 A1  M.F. Chang, A1  W. Shi, A1  W.K. Fuchs, PY  1990 KW  optimal diagnosis procedures; simulation results; koutofn structures; repairable VLSI; WSI structures; compact representation; online repair; offline repair; electronic engineering computing; integrated circuit testing; VLSI. VL  39 JA  IEEE Transactions on Computers ER   
Diagnosis strategies are investigated for repairable VLSI and WSI structures based on integrated diagnosis and repair. Knowledge of the repair strategy, the probability of each unit being good, and the expected test time of each unit is used by the diagnosis algorithm to select units for testing. The general problem is described, followed by an examination of a specific case. For koutofn structures, a complete proof is given for the optimal diagnosis procedure of Y. BenDov (1981). A compact representation of the optimal diagnosis procedure is described, which requires O(n/sup 2/) space and can be generated in O(n/sup 2/) time. Simulation results are provided to show the improvement in diagnosis time over online repair and offline repair.
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