This Article 
 Bibliographic References 
 Add to: 
Optimal Diagnosis Procedures for k-out-of-n Structures
April 1990 (vol. 39 no. 4)
pp. 559-564

Diagnosis strategies are investigated for repairable VLSI and WSI structures based on integrated diagnosis and repair. Knowledge of the repair strategy, the probability of each unit being good, and the expected test time of each unit is used by the diagnosis algorithm to select units for testing. The general problem is described, followed by an examination of a specific case. For k-out-of-n structures, a complete proof is given for the optimal diagnosis procedure of Y. Ben-Dov (1981). A compact representation of the optimal diagnosis procedure is described, which requires O(n/sup 2/) space and can be generated in O(n/sup 2/) time. Simulation results are provided to show the improvement in diagnosis time over online repair and offline repair.

[1] M.-F. Chang, W. K. Fuchs, and J. H. Patel, "Diagnosis and repair of memory with coupling faults,"IEEE Trans. Comput., vol. 38, pp. 493-500, Apr. 1989.
[2] R. W. Haddad and A. T. Dahbura, "Increased throughput for the testing and repair of RAMs with redundancy," inProc. IEEE Int. Conf. Comput.-Aided Design, 1987, pp. 230-233.
[3] W. K. Huang and F. Lombardi, "Minimizing the cost of repairing WSI memories," inProc. IEEE Int. Conf. Wafer Scale Integration, Jan. 1989, pp. 183-192.
[4] A. V. Ferris-Prabhu, L. D. Smith, H. A. Bonges, and J. K. Paulsen, "Radial yield variations in semiconductor wafers,"IEEE Circuits Devices, pp. 42-47, Mar. 1989.
[5] A. B. Leslie and A. F. Matta, "Wafer-level testing with a membrane probe,"IEEE Design Test Comput., vol. 6, pp. 10-17, Feb. 1989.
[6] J. Halpern, "Fault testing for ak-out-of-nsystem,"Oper. Res., vol. 22, pp. 1267-1271, Nov.-Dec. 1974.
[7] S. Salloum and M. A. Breuer, "An optimum testing algorithm for some symmetric coherent systems,"J. Math. Anal. Appl., vol. 101, pp. 170-194, 1984.
[8] Y. Ben-Dov, "Optimal testing procedures for special structures of coherent systems,"Management Sci., vol. 27, pp. 1410-1420, Dec. 1981.
[9] Y. Ben-Dov, "A branch and bound algorithm for minimizing the expected cost of testing coherent systems,"Euro. J. Oper. Res., vol. 7, pp. 284-289, 1981.
[10] P. Jedrzejowicz, "Minimizing the average cost of testing coherent systems: Complexity and approximation algorithms,"IEEE Trans. Reliability, vol. R-32, pp. 66-70, Apr. 1983.
[11] R. Butterworth, "Some reliability fault-testing models,"Oper. Res., vol. 20, pp. 335-343, Mar.-Apr. 1972.
[12] A. Tucker,Applied Combinatorics. New York: Wiley, 1980, pp. 109-112.

Index Terms:
optimal diagnosis procedures; simulation results; k-out-of-n structures; repairable VLSI; WSI structures; compact representation; online repair; offline repair; electronic engineering computing; integrated circuit testing; VLSI.
M.-F. Chang, W. Shi, W.K. Fuchs, "Optimal Diagnosis Procedures for k-out-of-n Structures," IEEE Transactions on Computers, vol. 39, no. 4, pp. 559-564, April 1990, doi:10.1109/12.54850
Usage of this product signifies your acceptance of the Terms of Use.