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B.R. Choi, K.H. Park, M. Kim, "An Improved Hardware Implementation of the FaultTolerant Clock Synchronization Algorithm for Large Multiprocessor Systems," IEEE Transactions on Computers, vol. 39, no. 3, pp. 404407, March, 1990.  
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@article{ 10.1109/12.48872, author = {B.R. Choi and K.H. Park and M. Kim}, title = {An Improved Hardware Implementation of the FaultTolerant Clock Synchronization Algorithm for Large Multiprocessor Systems}, journal ={IEEE Transactions on Computers}, volume = {39}, number = {3}, issn = {00189340}, year = {1990}, pages = {404407}, doi = {http://doi.ieeecomputersociety.org/10.1109/12.48872}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
RefWorks Procite/RefMan/Endnote  x  
TY  JOUR JO  IEEE Transactions on Computers TI  An Improved Hardware Implementation of the FaultTolerant Clock Synchronization Algorithm for Large Multiprocessor Systems IS  3 SN  00189340 SP404 EP407 EPD  404407 A1  B.R. Choi, A1  K.H. Park, A1  M. Kim, PY  1990 KW  faulttolerant clock synchronization algorithm; large multiprocessor systems; malicious faults; reference clock selection; lower gate complexity; smaller time delay; sorter; counting encoder; threshold generation logic; programmable registers; gate complexity; fault tolerant computing; multiprocessing systems; synchronisation. VL  39 JA  IEEE Transactions on Computers ER   
An improved implementation of clock synchronization of multiprocessor systems in the presence of malicious faults is proposed. The proposed hardware implementation for the reference clock selection has a lower gate complexity, smaller time delay, and greater flexibility than the previously published implementation. The improvement is achieved by replacing the sorter with a counting encoder and comparators and by introducing threshold generation logic with programmable registers. The scheme has a gate complexity of O(n) and a delay of O(log n), where n is the total number of inputs to a particular clock, and is programmable for different values of n and m, the maximum number of faults.
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