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Issue No.03 - March (1990 vol.39)
pp: 387-393
ABSTRACT
<p>The authors present the design of an 11-transistor combinational NMOS 1-out-of-3 code checker. The checker is totally self-checking (TSC) with respect to 36 faults out of a total of 58 faults defined at the NMOS switch and layout geometrical levels, and achieves the TSC goal of a checker for most of the fault sequences. The minimum fault sequences under which the TSC goal is lost are composed of at least three faults. This might be considered as a sufficient level of safety for some implementations.</p>
INDEX TERMS
combinational totally self-checking 1-out-of-3 code checkers; NMOS; TSC goal; fault sequences; minimum fault sequences; automatic testing; integrated logic circuits; logic design; logic testing; MOS integrated circuits.
CITATION
J.-C. Lo, S. Thanawastien, "On the Design of Combinational Totally Self-Checking 1-out-of-3 Code Checkers", IEEE Transactions on Computers, vol.39, no. 3, pp. 387-393, March 1990, doi:10.1109/12.48869
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